Fault-tolerence and reliability technique for high-density random-access measuring
By: Chakraborty, Kanad.
Publisher: New Delhi Pearson Edu. 2002Description: 426.ISBN: 81-78087693.Subject(s): ElectronicsDDC classification: 621.381| Item type | Current location | Call number | Status | Notes | Date due |
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Books
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Amity Central Library
Amity Central Library, Noida |
621.381 CHA-F (Browse shelf) | Available | AE 06390 |
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| 621.381 CHA- F Fundamentals of electronics | 621.381 CHA- F Fundamentals of electronics | 621.381 CHA- F Foundations of electronics | 621.381 CHA-F Fault-tolerence and reliability technique for high-density random-access measuring | 621.381 CHA-F Foundations of Electronics | 621.381 CHA-F Foundations of Electronics | 621.381 CHA-F Foundations of Electronics |
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